1 article(s) from Williams, R. Stanley

Characterization of electroforming-free titanium dioxide memristors

  • John Paul Strachan,
  • J. Joshua Yang,
  • L. A. Montoro,
  • C. A. Ospina,
  • A. J. Ramirez,
  • A. L. D. Kilcoyne,
  • Gilberto Medeiros-Ribeiro and
  • R. Stanley Williams

Beilstein J. Nanotechnol. 2013, 4, 467–473, doi:10.3762/bjnano.4.55

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Published 07 Aug 2013
 
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